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Dynamic Image Analysis (DIA) |
Static Image Analysis |
Sieve Analysis (Retsch) |
Laser Diffraction |
Dynamic Light Scattering (DLS) |
| Wide dynamic measurement range |
★ ★ |
x |
★ |
★ ★ |
★ |
| Reproducibility and repeatability |
★ ★ |
★ |
★ |
★ ★ |
★ |
| High resolution for narrow distributions |
★ ★ |
★ ★ |
x |
★ |
★ |
| Particle shape analysis |
★ |
★ ★ |
x |
x |
x |
| Direct measurement technique |
★ ★ |
★ ★ |
★ |
x |
x |
| Reliable detection of oversized grains |
★ ★ |
x |
★ ★ |
x |
★ |
| Robust hardware,easy operation for routine analysis |
★ ★ |
★ |
★ |
★ ★ |
★ |
| Analysis of individual particles |
★ |
★ ★ |
x |
x |
x |
| High measurement speed,short measurement times |
★ ★ |
x |
x |
★ ★ |
★ |
| Analysis of nano particles |
x |
x |
x |
★ |
★ ★ |
| Analysis of Zeta potential and molecular weight |
x |
x |
x |
x |
★ ★ |
| Versatility |
★ |
x |
★ |
★ ★ |
x |
| Measuring range |
0.8 µm – 135 mm |
0.5 µm – 1.5 mm |
10 µm – 125 mm |
10 nm – 5 mm |
0.8 nm – 6500 nm |