Dynamic Image Analysis (DIA) | Static Image Analysis | Sieve Analysis (Retsch) | Laser Diffraction | Dynamic Light Scattering (DLS) | |
---|---|---|---|---|---|
Wide dynamic measurement range | ★ ★ | x | ★ | ★ ★ | ★ |
Reproducibility and repeatability | ★ ★ | ★ | ★ | ★ ★ | ★ |
High resolution for narrow distributions | ★ ★ | ★ ★ | x | ★ | ★ |
Particle shape analysis | ★ | ★ ★ | x | x | x |
Direct measurement technique | ★ ★ | ★ ★ | ★ | x | x |
Reliable detection of oversized grains | ★ ★ | x | ★ ★ | x | ★ |
Robust hardware,easy operation for routine analysis | ★ ★ | ★ | ★ | ★ ★ | ★ |
Analysis of individual particles | ★ | ★ ★ | x | x | x |
High measurement speed,short measurement times | ★ ★ | x | x | ★ ★ | ★ |
Analysis of nano particles | x | x | x | ★ | ★ ★ |
Analysis of Zeta potential and molecular weight | x | x | x | x | ★ ★ |
Versatility | ★ | x | ★ | ★ ★ | x |
Measuring range | 0.8 µm – 135 mm | 0.5 µm – 1.5 mm | 10 µm – 125 mm | 10 nm – 5 mm | 0.8 nm – 6500 nm |