As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, Rigaku’s range of EDXRFs delivers wide elemental coverage. It non-destructively analyzeselements from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries
Rigaku NEX DE
- Analyze 11Na to 92U non-destructively
- Powerful QuantEZ Windows-based software
- Solids, liquids, alloys, powders and films
- 60kV X-ray tube for wide elemental coverage
- FAST SDD® detector for superior data
- Six automated tube filters
- Unmatched performance-to-price ratio
- Powerful Qualitative & Quantitative software RPF-SQX features Rigaku’s famous Rigaku Profile Fitting (RPF) technology
Rigaku NEX QC+
- Analyze 11Na to 92U non-destructively
- Powerful QuantEZ Windows-based software
- Solids, liquids, alloys, powders and films
- 50kV X-ray tube for wide elemental coverage
- SDD detector for superior resolution
- Multiple automated tube filters
- Unmatched performance-to-price ratio
- Optional RPF-SQX fundamental parameters
Rigaku NEX QC
- Analyze 11 Na to 92 U non-destructively
- Self cointained with a thermal printer
- Solids, liquids, alloys, powders and thin films
- 50kV X-ray tube for wide elemental coverage
- Semiconductor detector for superior data quality
- Modern style smartphone “icon driven” user interface
- Multiple automated tube filters for enhanced sensitivity
- With low cost unmatched performance-to-price ratio
NEX CG II
Next-generation Advanced Cartesian Geometry EDXRF for Rapid Qualitative and Quantitative Elemental Analysis.
NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.
- Non-destructive elemental analysis for sodium (Na) to uranium (U)
- Quick elemental analyses of solids, liquids, powders, coatings, and thin films
- Indirect excitation for exceptionally low detection limits
- High-power 50 kV 50 W X-ray tube
- Large-area high-throughput silicon drift detector (SDD)
- Analysis in air, helium, or vacuum
- Powerful and easy to use QuantEZ® software with multilingual user interface
- Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP
- Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
- Various automatic sample changers accommodating up to 52 mm samples
