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Bench-top EDXRF

As a premium high performance benchtop Energy Dispersive X-ray Fluorescence (EDXRF) elemental analyzer, Rigaku’s range of EDXRFs delivers wide elemental coverage. It non-destructively analyzeselements from sodium (Na) through uranium (U) in almost any matrix, from solids and alloys to powders, liquids and slurries

XRF Rigaku NEX DE

Rigaku NEX DE

  • Analyze 11Na to 92U non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders and films
  • 60kV X-ray tube for wide elemental coverage
  • FAST SDD® detector for superior data
  • Six automated tube filters
  • Unmatched performance-to-price ratio
  • Powerful Qualitative & Quantitative software RPF-SQX features Rigaku’s famous Rigaku Profile Fitting (RPF) technology


Rigaku NEX QC+

  • Analyze 11Na to 92U non-destructively
  • Powerful QuantEZ Windows-based software
  • Solids, liquids, alloys, powders and films
  • 50kV X-ray tube for wide elemental coverage
  • SDD detector for superior resolution
  • Multiple automated tube filters
  • Unmatched performance-to-price ratio
  • Optional RPF-SQX fundamental parameters
XRF Rigaku NEX QC+

Rigaku NEX QC

Rigaku NEX QC

  • Analyze 11 Na to 92 U non-destructively
  • Self cointained with a thermal printer
  • Solids, liquids, alloys, powders and thin films
  • 50kV X-ray tube for wide elemental coverage
  • Semiconductor detector for superior data quality
  • Modern style smartphone “icon driven” user interface
  • Multiple automated tube filters for enhanced sensitivity
  • With low cost unmatched performance-to-price ratio

NEX CG II

Next-generation Advanced Cartesian Geometry EDXRF for Rapid Qualitative and Quantitative Elemental Analysis.

NEX CG II, a powerful second-generation energy dispersive X-ray fluorescence (EDXRF) spectrometer, delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types — from oils and liquids to solids, metals, polymers, powders, pastes, coatings, and thin films.

  • Non-destructive elemental analysis for sodium (Na) to uranium (U)
  • Quick elemental analyses of solids, liquids, powders, coatings, and thin films
  • Indirect excitation for exceptionally low detection limits
  • High-power 50 kV 50 W X-ray tube
  • Large-area high-throughput silicon drift detector (SDD)
  • Analysis in air, helium, or vacuum
  • Powerful and easy to use QuantEZ® software with multilingual user interface
  • Advanced RPF-SQX Fundamentals Parameters software featuring Scattering FP
  • Rigaku Profile Fitting (RPF) advanced algorithm for peak deconvolution
  • Various automatic sample changers accommodating up to 52 mm samples

 

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