Total Reflection XRF (TXRF)

World’s first portable benchtop spectrometer for fast quantitative and semi-quantitative multi-element microanalysis of liquids, suspensions, solids and contaminations using the principle of total reflection X-ray fluorescence spectroscopy (TXRF). Total reflection X-ray fluorescence spectrometry (TXRF) is a well-established method for trace element analysis on a variety of samples.

S2 PICOFOX

Transportable TXRF spectrometer for ultra-trace (sub-ppb) elemental analysis of very small sample amounts in the ng or µg range: low operating cost, “green” technology

S4 T-STAR

High-volume TXRF spectrometer for ultra-trace (sub-ppm) elemental analysis of very small sample amounts in the pg, ng or µg range: low operating cost, “green” technology.

Products

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XRF Sample Preparation
Consumable for XRF Analysis
Portable X-ray Diffractometer
OES – Spark Spectrometer
CS/ONH Analyzers
Particle Size Analysis & Classification
High Temperature Laboratory Furnaces

S2 PICOFOX

S4 T-STAR

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Products